Generic data format approach for generation of security test data

Christian Schanes, Florian Fankhauser, Stefan Taber, Thomas Grechenig
DB

Abstract

Security testing is an important and at the same time also expensive task for developing robust and secure systems. Test automation can reduce costs of security tests and increase test coverage and, therefore, increase the number of detected security issues during development. A common data format as the basis for specific test cases ensures that the implementation of the generation logic for security test data is only needed once and can be used for various data formats by transforming the data to the common data format, generating the test data and transforming back to the original data format. The introduced approach enables to generate test data for various formats using a single implementation of the generation algorithm and applying the results for specific test cases in different data formats.

Type
Conference paper
Publication
Talk: The Third International Conference on Advances in System Testing and Validation Lifecycle, Barcelona, Spain; 10-23-2011 - 10-28-2011; in: “Proceedings of the Third International Conference on Advances in System Testing and Validation Lifecycle”, IARIA, 2011 (2011), ISBN: 978-1-61208-168-7; 103 - 108
Christian Schanes
Projektass. Dipl.-Ing. Dr.techn.
Florian Fankhauser
Projektass. Dipl.-Ing.
Thomas Grechenig
Thomas Grechenig
Ao.Univ.Prof. Dipl.-Ing. Dr.techn.